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JEOL JSM-840 Scanning Electron Microscope w/ XRF CRT Controls

Description: model: JEOL JSM-840 Make: JEOL Model: JSM-850 Condition: Used, Overall In Good Shape, Was working but hasn't been used for years plenty of spare cathodes and accessories CHILLER SOLD SEPARATELY 80s model Comes with XRF and CRT Control Panel Variable Accelerating Voltage: 200-40,000V Variable Probe Current: 1x10E-8 to 1x10E-12 Amps Maximum Sample Size of 6" in any one dimension Working Distance: 8-48mm Sample Rotation: 360 deg. Sampling Tilting: 60 deg? Variable magnification: 10x - 30,000x Maximum Resolution: 10nm Overview: Type: Microscopes Brand: JEOL Model: JSM-840 Stock #: 22341 specifications:

Price: 4000 USD

Location: Austin, Texas

End Time: 2025-01-31T17:38:01.000Z

Shipping Cost: N/A USD

Product Images

JEOL JSM-840 Scanning Electron Microscope w/ XRF CRT ControlsJEOL JSM-840 Scanning Electron Microscope w/ XRF CRT ControlsJEOL JSM-840 Scanning Electron Microscope w/ XRF CRT ControlsJEOL JSM-840 Scanning Electron Microscope w/ XRF CRT Controls

Item Specifics

All returns accepted: ReturnsNotAccepted

Return policy details:

Type: Microscopes

Brand: JEOL

MPN: JSM-840

Model: JSM-840

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