Description: Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization, Paperback by Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald, ISBN 9811044325, ISBN-13 9789811044328, Like New Used, Free shipping in the US This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
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Book Title: Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
Number of Pages: Xii, 137 Pages
Language: English
Publisher: Springer
Publication Year: 2017
Topic: Materials Science / General, Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical
Illustrator: Yes
Genre: Technology & Engineering, Science
Item Weight: 85 Oz
Author: Nicolas Brodusch, Raynald Gauvin, Hendrix Demers
Item Length: 9.3 in
Item Width: 6.1 in
Book Series: Springerbriefs in Applied Sciences and Technology Ser.
Format: Trade Paperback
